AuthorsJ. S. Molléri, I. Nurdiani, F. Fotrousi, and K. Petersen
EditorsV. Garousi, and S. Ali
TitleExperiences of studying Attention through EEG in the Context of Review Tasks
AfilliationSoftware Engineering
Project(s)Department of IT Management, Simula Metropolitan Center for Digital Engineering
StatusPublished
Publication TypeProceedings, refereed
Year of Publication2019
Conference Namethe Evaluation and AssessmentProceedings of the Evaluation and Assessment on Software Engineering - EASE '19
PublisherACM Press
Place PublishedCopenhagen, DenmarkNew York, New York, USA
ISBN Number9781450371452
Keywordsattention, experiment, human subjects, lectroencephalogram
Abstract

Context: Electroencephalograms (EEG) have been used in a few cases in the context of software engineering (SE). EEGs allow capturing emotions and cognitive functioning. Such human factors have already shown to be important to understand software engineering tasks. Therefore, it is essential to gain experience in the community to utilize EEG as a research tool. Objective: To report experiences of using EEG in the context of a software engineering education (review of master theses proposals). We provide our reflections and lessons learned of (1) how to plan an EEG study, (2) how to conduct and execute (e.g., tools), (3) how to analyze. Method: We carried out an experiment using an EEG headset to measure the participants' attention rate. The experiment task includes reviewing three master thesis project plans. Results: We describe how we evolved our understanding of experimentation practices to collect and analyze psychological and cognitive data. We also provide a set of lessons learned regarding the application of EEG technology for research. Conclusions: We believe that that EEG could benefit software engineering research to collect cognitive information under certain conditions. The lessons learned reported here should be used as inputs for future experiments in software engineering, where human aspects are of interest.

URLhttp://dl.acm.org/citation.cfm?doid=3319008http://dl.acm.org/citation.cfm?doid=3319008.3319357http://dl.acm.org/ft_gateway.cfm?id=3319357&ftid=2047753&dwn=1
DOI10.1145/331900810.1145/3319008.3319357
Citation Key26646